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X-Ray and CT inspection - XT H 225 ST 2x picture

Nikon - XT H 225 ST 2x

Productivity without compromise
The integration of industry-leading features into the XT H 225 ST 2x microfocus X-ray CT system allows a doubling of data acquisition speed and hence of inspection productivity. It is a result of using advanced detector technology combined with new functionality including Half.Turn CT and Rotating.Target 2.0.

Five unique new features:

  • Rotating.Target 2.0
  • Local.Calibration
  • Auto.Filament Control
  • Quick.Change
  • Half.Turn CT