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JEOL Neoscope JCM 7000 SEM
JEOL Neoscope JCM 7000 SEM
The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions:
- "Zeromag" for smooth transition from optical to SEM imaging
- "Live Analysis" for finding constituent elements for an image observation area
- "Live 3D" for displaying a reconstructed live 3D image during SEM observation.