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Microscope - Industrial - JEOL Neoscope JCM 7000 SEM picture

JEOL Neoscope JCM 7000 SEM

JEOL Neoscope JCM 7000 SEM

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions:

  • "Zeromag" for smooth transition from optical to SEM imaging
  • "Live Analysis" for finding constituent elements for an image observation area
  • "Live 3D" for displaying a reconstructed live 3D image during SEM observation.