 
                        XT H 225 ST 2x
Productivity without compromise. The integration of industry-leading features into the XT H 225 ST 2x microfocus X-ray CT system allows a doubling of data acquisition speed and hence of inspection productivity. It is a result of using advanced detector technology combined with new functionality including Half.Turn CT and Rotating.Target 2.0.
                                                
                                                    Product Information
                                                    
                                                
                                            
                                            Rotating.Target 2.0
Local.Calibration
Auto.Filament Control
Quick.Change
Half.Turn CT
Related products
 
        
        
    - 
                            
    Christian ClementSales Manager - Work area: Sales & Application
- Special area: Microscopy
- Phone +45 81 77 71 16
- Email: cc@ramcon.dk
 
 
            



