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Nikon - MCT225
- 50 years' experience of Coordinate Measuring Machine (CMM) metrology blended with 25 years' experience of X-ray Computed Tomography (CT)
- Absolute accuracy 9 + L/50 μm in accordance with the VDI/VDE 2630
- Proprietary micro-focus source developed for metrology CT purposes
- High-precision mechatronics increase sample manipulation accuracy
- Straightforward manual use and automation process flow execution
- Powerful visualization and analysis provide detailed insight
- Suitable for wide range of sample sizes and material densities