ZSX Primus IV
TUBE-ABOVE SEQUENTIAL WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER. Elemental analysis of solids, liquids, powders, alloys and thin films. As a tube-above sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Exceptional light element XRF performance with inverted optics for superior reliability. ZSX Primus IV features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time. Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus IV WDXRF spectrometer features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits.
Mapping and multi-spot XRF analysis. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus IV allows easy detailed XRF spectrometric investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.
Analysis of elements from Be to U
ZSX Guidance expert system software
Digital multi-channel analyzer (D-MCA)
EZ Analysis interface for routine measurements
Tube above optics minimizes contamination issues
Small footprint uses less valuable lab space
Micro analysis to analyze samples as small as 500 µm
30μ tube delivers superior light element performance
Mapping feature for elemental topography/distribution
Helium seal means the optics are always under vacuum