NEX CG II
Energy Dispersive X-ray Fluorescence Spectrometer. Next-generation Advanced Cartesian Geometry EDXRF for Rapid Qualitative and Quantitative Elemental Analysis. NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
Product Information
Non-destructive elemental analysis for sodium (Na) to uranium (U)
Quick elemental analyses of solids, liquids, powders, coatings, and thin films
Indirect excitation for exceptionally low detection limits
High-power 50 kV 50 W X-ray tube
Large-area high-throughput silicon drift detector (SDD)
Analysis in air, helium, or vacuum
Powerful and easy to use QuantEZ® software with multilingual user interface
Advanced RPF-SQX Fundamentals Parameters software featuring Scattering FP
Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
Various automatic sample changers accommodating up to 52 mm samples
Low cost of ownership backed by a 2-year warranty
Related products
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Alexander Fogh
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +45 81 88 49 08
- Email: asf@ramcon.dk
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Amalie Kofoed Jørgensen
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +45 50 60 05 15
- Email: akj@ramcon.dk
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Christian Hansson
Product Specialist
- Work area: Sales & Application
- Special area: Material Characterization
- Phone +46 70 231 40 71
- Email: ch@ramcon.se